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IV + EL Solar Cell Automatic Sorting Machine
Product Introduction： This equipment is mainly used to simulate sunlight and collect the I-V characteristic curves of crystalline silicon photovoltaic cells. It adopts a long-arc pulsed xenon lamp as the transient light source, and the light source grade meets the IEC60904-9 ed3 A+A+A+ grade. It can measure the I-V curves, P-V curves, irradiance lines, short-circuit current, open-circuit voltage, peak power, peak power point voltage and current, fill factor, conversion efficiency, series resistance, and parallel resistance of conventional polycrystalline, monocrystalline Perc, Topcon, BC, heterojunction and other high-capacitance cells.
Key Parameters
Standard
IEC60904-9:2020
Light type
Pulsed xenon lamp
Light source lifetime
≥2000000
Spectrum wavelength
300-1200nm
Classification of light source
Spectral match is 0.875-1.125, class A+
Non-uniformity is ≤1%, class A+
Instability is ≤1%, class A+
Non-uniformity is ≤1%, class A+
Instability is ≤1%, class A+
Irradiance intensity
200W/㎡~1200W/㎡
Illumination area
240*240mm
Other size is customizable
Other size is customizable
Repeatability
≤0.03%
Pulse duration
10-100ms, in step of 1ms
Testing technology
Standard features include I-V and V-I sweep, integrated advanced hysteresis testing mode, intelligent testing technology (IAT), and dark field measurement capabilities
Measurable Cell type
Conventional polysilicon, PERC , TOPCon , BC , HJT, CIGS, GaAs, and CdTe cells
Capacity
≥2200pcs/h, higher speed machine is customizable
Postioning
Optical positioning
Material loading
2 Bins
Material unloading
4 Bins, taking by Bernoulli vacuum sucker
Optional service
Rear side light is designed for measurement of bifacial solar cells
EL testing system can achieve IV and EL testing at a same production section
AOI testing system, to realize automatic sorting of color
Integrated with IR infrared thermal imager to realize heat spot testing
Double channels testing technology, to achieve simultaneous testing of two half-cut
cells
EL testing system can achieve IV and EL testing at a same production section
AOI testing system, to realize automatic sorting of color
Integrated with IR infrared thermal imager to realize heat spot testing
Double channels testing technology, to achieve simultaneous testing of two half-cut
cells
